Publications

Article

Cobo, Elie and Massenot, Sébastien and Le Roch, Alexandre and Corbière, Franck and Goiffon, Vincent and Magnan, Pierre and Pelouard, Jean-Luc. Design of a CMOS image sensor pixel with embedded polysilicon nano-grating for near-infrared imaging enhancement. (2022) Applied Optics, 61 (4). 960-968. ISSN 1559-128X

Dewitte, Hugo and Rizzolo, Serena and Paillet, Philippe and Magnan, Pierre and Le Roch, Alexandre and Corbière, Franck and Molina, Romain and Girard, Sylvain and Allanche, Timothé and Muller, Cyprien and Desjonquères, Hortense and Macé, Jean Reynald and Baudu, Jean-Pierre and Flores, A. Saravia and Goiffon, Vincent. Annealing Effects on Radiation-Hardened CMOS Image Sensors Exposed to Ultrahigh Total Ionizing Doses. (2020) IEEE Transactions on Nuclear Science, 67 (7). 1284-1292. ISSN 0018-9499

Rizzolo, Serena and Le Roch, Alexandre and Marcelot, Olivier and Corbière, Franck and Paillet, Philippe and Gaillardin, Marc and Magnan, Pierre and Goiffon, Vincent. High Displacement Damage Dose Effects in Radiation Hardened CMOS Image Sensors. (2020) IEEE Transactions on Nuclear Science, 67 (7). 1256-1262. ISSN 0018-9499

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Marcelot, Olivier and Dewitte, Hugo and Van Uffelen, Marco and Casellas, Laura Mont and Magnan, Pierre and Goiffon, Vincent. Phosphorus Versus Arsenic: Role of the Photodiode Doping Element in CMOS Image Sensor Radiation-Induced Dark Current and Random Telegraph Signal. (2020) IEEE Transactions on Nuclear Science, 67 (7). 1241-1250. ISSN 0018-9499

Le Roch, Alexandre and Virmontois, Cedric and Paillet, Philippe and Warner, Jeffrey H. and Belloir, Jean-Marc and Magnan, Pierre and Goiffon, Vincent. Comparison of X-Ray and Electron Radiation Effects on Dark Current Non-Uniformity and Fluctuations in CMOS Image Sensors. (2020) IEEE Transactions on Nuclear Science, 67 (1). 268-277. ISSN 0018-9499

Goiffon, Vincent and Bilba, Teddy and Deladerriere, Theo and Beaugendre, Guillaume and Le Roch, Alexandre and Dion, Arnaud and Virmontois, Cédric and Belloir, Jean-Marc and Gaillardin, Marc and Jay, Antoine and Paillet, Philippe. Radiation Induced Variable Retention Time in Dynamic Random Access Memories. (2020) IEEE Transactions on Nuclear Science, 67 (1). 1-13. ISSN 0018-9499

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Magnan, Pierre and Goiffon, Vincent. Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions. (2019) IEEE Transactions on Nuclear Science, 66 (3). 616-624. ISSN 0018-9499

Le Roch, Alexandre and Virmontois, Cédric and Goiffon, Vincent and Tauziède, Laurie and Belloir, Jean-Marc and Durnez, Clémentine and Magnan, Pierre. Radiation-Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Applications. (2018) IEEE Transactions on Nuclear Science, 65 (8). 1645-1653. ISSN 0018-9499

Durnez, Clémentine and Goiffon, Vincent and Virmontois, Cédric and Rizzolo, Serena and Le Roch, Alexandre and Magnan, Pierre and Paillet, Philippe and Marcandella, Claude and Rubaldo, Laurent. Total Ionizing Dose Radiation-Induced Dark Current Random Telegraph Signal in Pinned Photodiode CMOS Image Sensors. (2018) IEEE Transactions on Nuclear Science, 65 (1). 92-100. ISSN 0018-9499

Conference or Workshop Item

Jay, Antoine and Hemeryck, Anne and Cristiano, Fuccio and Rideau, Denis and Julliard, Pierre-Louis and Goiffon, Vincent and Le Roch, Alexandre and Martin-Samos, Layla and Gironcoli, Stefano De and Richard, Nicolas. Clusters of Defects as a Possible Origin of Random Telegraph Signal in Imager Devices: a DFT based Study. (2021) In: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 27 September 2021 - 29 September 2021 (Dallas, United States).

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Goiffon, Vincent. Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Floating Diffusions. (2019) In: 2018 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2018), 16 July 2018 - 20 July 2018 (Kona, United States).

Dewitte, Hugo and Rizzolo, Serena and Paillet, Philippe and Magnan, Pierre and Le Roch, Alexandre and Corbière, Franck and Molina, Romain and Girard, Sylvain and Allanche, Timothé and Muller, Cyprien and Desjonquères, Hortense and Macé, Jean Reynald and Baudu, Jean-Pierre and Saravia Flores, A. and Goiffon, Vincent. Annealing Effects on Radiation Hardened CMOS Image Sensors Exposed to Ultra High Total Ionizing Doses. (2019) In: Radiation and its Effects on Components and Systems - RADECS 2019, 16 September 2019 - 20 September 2019 (Montpellier, France).

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Magnan, Pierre and Goiffon, Vincent. Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions. (2018) In: IEEE Nuclear and Space Radiation Effects Conference (NSREC 2018), 16 July 2018 - 20 July 2018 (Kona, United States).

Le Roch, Alexandre and Goiffon, Vincent and Durnez, Clémentine and Magnan, Pierre and Virmontois, Cédric and Pistre, L. and Belloir, Jean-Marc. Radiation Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Application. (2017) In: RADECS 2017 : Radiation and Its Effects on Components and Systems, 2 October 2017 - 6 October 2017 (Geneva, Switzerland). (Unpublished)

Le Roch, Alexandre and Goiffon, Vincent and Durnez, Clémentine and Magnan, Pierre and Virmontois, Cédric and Pistre, L. and Belloir, Jean-Marc. Radiation-Induced Defects in a Commercial Image Sensor for Space Applications. (2017) In: CNES Workshop: CMOS Image Sensors for High Performance Applications, 21 November 2017 - 22 November 2017 (Toulouse, France). (Unpublished)