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Paillet, Philippe and Girard, Sylvain and Goiffon, Vincent and Duhamel, Olivier and Morana, Adriana and Lambert, Damien and De Michele, Vincenzo and Campanella, Cosimo and Melin, Gilles and Robin, Thierry and Vidalot, Jeoffray and Meyer, Arnaud and Boukenter, Aziz and Ouerdane, Youcef and Marin, Emmanuel and Glebov, Vladimir Yu. and Pien, Gregory. Phosphosilicate Multimode Optical Fiber for Sensing and Diagnostics at Inertial Confinement Fusion Facilities. (2022) IEEE Sensors Journal, 22 (23). 22700-22706. ISSN 1530-437X

Cobo, Elie and Massenot, Sébastien and Le Roch, Alexandre and Corbière, Franck and Goiffon, Vincent and Magnan, Pierre and Pelouard, Jean-Luc. Design of a CMOS image sensor pixel with embedded polysilicon nano-grating for near-infrared imaging enhancement. (2022) Applied Optics, 61 (4). 960-968. ISSN 1559-128X

Lucas, Sylvain and Oberlin, Thomas and Goiffon, Vincent and Le Mer, Fanny. Automatic Detection and Correction of Random Telegraph Signal Artifacts in Earth Observation Images. (2022) IEEE Geoscience and Remote Sensing Letters, 19. 1-5. ISSN 1545-598X

Dewitte, Hugo and Rizzolo, Serena and Paillet, Philippe and Magnan, Pierre and Le Roch, Alexandre and Corbière, Franck and Molina, Romain and Girard, Sylvain and Allanche, Timothé and Muller, Cyprien and Desjonquères, Hortense and Macé, Jean Reynald and Baudu, Jean-Pierre and Flores, A. Saravia and Goiffon, Vincent. Annealing Effects on Radiation-Hardened CMOS Image Sensors Exposed to Ultrahigh Total Ionizing Doses. (2020) IEEE Transactions on Nuclear Science, 67 (7). 1284-1292. ISSN 0018-9499

Rizzolo, Serena and Le Roch, Alexandre and Marcelot, Olivier and Corbière, Franck and Paillet, Philippe and Gaillardin, Marc and Magnan, Pierre and Goiffon, Vincent. High Displacement Damage Dose Effects in Radiation Hardened CMOS Image Sensors. (2020) IEEE Transactions on Nuclear Science, 67 (7). 1256-1262. ISSN 0018-9499

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Marcelot, Olivier and Dewitte, Hugo and Van Uffelen, Marco and Casellas, Laura Mont and Magnan, Pierre and Goiffon, Vincent. Phosphorus Versus Arsenic: Role of the Photodiode Doping Element in CMOS Image Sensor Radiation-Induced Dark Current and Random Telegraph Signal. (2020) IEEE Transactions on Nuclear Science, 67 (7). 1241-1250. ISSN 0018-9499

Le Roch, Alexandre and Virmontois, Cedric and Paillet, Philippe and Warner, Jeffrey H. and Belloir, Jean-Marc and Magnan, Pierre and Goiffon, Vincent. Comparison of X-Ray and Electron Radiation Effects on Dark Current Non-Uniformity and Fluctuations in CMOS Image Sensors. (2020) IEEE Transactions on Nuclear Science, 67 (1). 268-277. ISSN 0018-9499

Goiffon, Vincent and Bilba, Teddy and Deladerriere, Theo and Beaugendre, Guillaume and Le Roch, Alexandre and Dion, Arnaud and Virmontois, Cédric and Belloir, Jean-Marc and Gaillardin, Marc and Jay, Antoine and Paillet, Philippe. Radiation Induced Variable Retention Time in Dynamic Random Access Memories. (2020) IEEE Transactions on Nuclear Science, 67 (1). 1-13. ISSN 0018-9499

Durnez, Clémentine and Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Rubaldo, Laurent. Comparison of Dark Current Random Telegraph Signals in Silicon and InSb-Based Photodetector Pixel Arrays. (2020) IEEE Transactions on Electron Devices, 67 (11). 4940-4946. ISSN 0018-9383

Jay, Antoine and Huet, Christophe and Salles, Nicolas and Gunde, Miha and Martin-Samos, Layla and Richard, Nicolas and Landa, Georges and Goiffon, Vincent and De Gironcoli, Stefano and Hémeryck, Anne and Mousseau, Normand. Finding Reaction Pathways and Transition States: r-ARTn and d-ARTn as an Efficient and Versatile Alternative to String Approaches. (2020) Journal of Chemical Theory and Computation, 16 (10). 6726-6734. ISSN 1549-9618

Marcelot, Olivier and Goiffon, Vincent and Magnan, Pierre. Exploration of Pinned Photodiode Radiation Hardening Solutions Through TCAD Simulations. (2019) IEEE Transactions on Electron Devices, 66 (8). 3411-3416. ISSN 0018-9383

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Magnan, Pierre and Goiffon, Vincent. Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions. (2019) IEEE Transactions on Nuclear Science, 66 (3). 616-624. ISSN 0018-9499

Rizzolo, Serena and Goiffon, Vincent and Corbière, Franck and Molina, Romain and Chabane, Aziouz and Girard, Sylvain and Paillet, Philippe and Magnan, Pierre and Boukenter, Aziz and Allanche, Timothé and Muller, Cyprien and Monsanglant-Louvet, Celine and Osmond, Melanie and Desjonquères, Hortense and Macé, Jean Reynald and Burnichon, Pierre and Baudu, Jean-Pierre and Plumeri, Stéphane. Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels. (2019) IEEE Transactions on Nuclear Science, 66 (1). 111-119. ISSN 0018-9499

Le Roch, Alexandre and Virmontois, Cédric and Goiffon, Vincent and Tauziède, Laurie and Belloir, Jean-Marc and Durnez, Clémentine and Magnan, Pierre. Radiation-Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Applications. (2018) IEEE Transactions on Nuclear Science, 65 (8). 1645-1653. ISSN 0018-9499

Rizzolo, Serena and Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Martin-Gonthier, Philippe and Magnan, Pierre. Influence of Pixel Design on Charge Transfer Performances in CMOS Image Sensors. (2018) IEEE Transactions on Electron Devices, 65 (3). 1048-1055. ISSN 0018-9383

Goiffon, Vincent and Rizzolo, Serena and Corbière, Franck and Rolando, Sébastien and Bounasser, Said and Sergent, Marius and Chabane, Aziouz and Marcelot, Olivier and Estribeau, Magali and Magnan, Pierre and Paillet, Philippe and Girard, Sylvain and Gaillardin, Marc and Marcandella, Claude and Allanche, Timothé and Van Uffelen, Marco and Casellas, Laura Mont and Scott, Robin and De Cock, Wouter. Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling. (2018) IEEE Transactions on Nuclear Science, 65 (1). 101-110. ISSN 0018-9499

Durnez, Clémentine and Goiffon, Vincent and Virmontois, Cédric and Rizzolo, Serena and Le Roch, Alexandre and Magnan, Pierre and Paillet, Philippe and Marcandella, Claude and Rubaldo, Laurent. Total Ionizing Dose Radiation-Induced Dark Current Random Telegraph Signal in Pinned Photodiode CMOS Image Sensors. (2018) IEEE Transactions on Nuclear Science, 65 (1). 92-100. ISSN 0018-9499

Allanche, Timothé and Paillet, Philippe and Goiffon, Vincent and Muller, Cyprien and Van Uffelen, Marco and Mont-Casellas, Laura and Duhamel, Olivier and Marcandella, Claude and Rizzolo, Serena and Magnan, Pierre and Clerc, Raphael and Lépine, Thierry and Hébert, Mathieu and Boukenter, Aziz and Ouerdane, Youcef and Scott, Robin and De Cock, Wouter and Girard, Sylvain. Vulnerability and Hardening Studies of Optical and Illumination Systems at MGy Dose Levels. (2018) IEEE Transactions on Nuclear Science, 65 (1). 132-140. ISSN 0018-9499

Rizzolo, Serena and Goiffon, Vincent and Estribeau, Magali and Paillet, Philippe and Marcandella, Claude and Durnez, Clémentine and Magnan, Pierre. Total-Ionizing Dose Effects on Charge Transfer Efficiency and Image Lag in Pinned Photodiode CMOS Image Sensors. (2018) IEEE Transactions on Nuclear Science, 65 (1). 84-91. ISSN 0018-9499

Marcelot, Olivier and Goiffon, Vincent and Rizzolo, Serena and Pace, Federico and Magnan, Pierre. Dark Current Sharing and Cancellation Mechanisms in CMOS Image Sensors Analyzed by TCAD Simulations. (2017) IEEE Transactions on Electron Devices, 64 (12). 4985-4991. ISSN 0018-9383

Belloir, Jean-Marc and Lincelles, Jean-Baptiste and Pelamatti, Alice and Durnez, Clémentine and Goiffon, Vincent and Virmontois, Cédric and Paillet, Philippe and Magnan, Pierre and Gilard, Olivier. Dark Current Blooming in Pinned Photodiode CMOS Image Sensors. (2017) IEEE Transactions on Electron Devices, 64 (3). 11161-1166. ISSN 0018-9383

Marcelot, Olivier and Goiffon, Vincent and Nallet, Franck and Magnan, Pierre. Pinned Photodiode CMOS Image Sensor\\TCAD Simulation: in-Depth Analysis of in-Pixel Pinning Voltage Measurement for a Diagnostic Tool. (2017) IEEE Transactions on Electron Devices, 64 (2). 455-462. ISSN 0018-9383

Belloir, Jean-Marc and Goiffon, Vincent and Raine, Mélanie and Virmontois, Cédric and Durnez, Clémentine and Paillet, Philippe and Magnan, Pierre and Gilard, Olivier and Molina, Romain. Dark Current Spectroscopy in neutron, proton and ion irradiated CMOS Image Sensors: from Point Defects to Clusters. (2017) IEEE Transactions on Nuclear Science, 64 (1). 27-37. ISSN 0018-9499

Durnez, Clémentine and Goiffon, Vincent and Virmontois, Cédric and Belloir, Jean-Marc and Magnan, Pierre and Rubaldo, Laurent. In-Depth Analysis on Radiation Induced Multi-Level Dark Current Random Telegraph Signal in Silicon Solid State Image Sensors. (2017) IEEE Transactions on Nuclear Science, 64 (1). 19-26. ISSN 0018-9499

Goiffon, Vincent and Rolando, Sébastien and Corbière, Franck and Rizzolo, Serena and Chabane, Aziouz and Girard, Sylvain and Baer, Jérémy and Estribeau, Magali and Magnan, Pierre and Paillet, Philippe and Van Uffelen, Marco and Mont Casellas, Laura and Scott, Robin and Gaillardin, Marc and Marcandella, Claude and Marcelot, Olivier and Allanche, Timothé. Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments. (2017) IEEE Transactions on Nuclear Science, 64 (1). 45-53. ISSN 0018-9499

Raine, Mélanie and Jay, Antoine and Richard, Nicolas and Goiffon, Vincent and Girard, Sylvain and Gaillardin, Marc and Paillet, Philippe. Simulation of Single Particle Displacement Damage in Silicon – Part I: Global Approach and Primary Interaction Simulation. (2017) IEEE Transactions on Nuclear Science, 64 (1). 133-140. ISSN 0018-9499

Jay, Antoine and Raine, Mélanie and Richard, Nicolas and Mousseau, Normand and Goiffon, Vincent and Hémeryck, Anne and Magnan, Pierre. Simulation of Single Particle Displacement Damage in Silicon – Part II: Generation and Long-Time Relaxation of Damage Structure. (2017) IEEE Transactions on Nuclear Science, 64 (1). 141-148. ISSN 0018-9499

Pelamatti, Alice and Goiffon, Vincent and Chabane, Aziouz and Magnan, Pierre and Virmontois, Cédric and Saint-Pé, Olivier and Breart de Boisanger, Michel. Charge Transfer Inefficiency in Pinned Photodiode CMOS image sensors: Simple Montecarlo modeling and experimental measurement based on a pulsed storage-gate method. (2016) Solid-State Electronics, 125. 227-233. ISSN 0038-1101

Belloir, Jean-Marc and Goiffon, Vincent and Virmontois, Cédric and Paillet, Philippe and Raine, Mélanie and Magnan, Pierre and Gilard, Olivier. Dark Current Spectroscopy on Alpha Irradiated Pinned Photodiode CMOS Image Sensors. (2016) IEEE Transactions on Nuclear Science, 63 (4). 2183-2192. ISSN 0018-9499

Pelamatti, Alice and Goiffon, Vincent and De Ipanema Moreira, Alexis and Magnan, Pierre and Virmontois, Cédric and Saint-Pé, Olivier and Breart de Boisanger, Michel. Comparison of Pinning Voltage Estimation Methods in Pinned Photodiode CMOS Image Sensors. (2016) IEEE Journal of the Electron Devices Society, 4 (2). 99-108. ISSN 2168-6734

Belloir, Jean-Marc and Goiffon, Vincent and Virmontois, Cédric and Raine, Mélanie and Paillet, Philippe and Duhamel, Olivier and Gaillardin, Marc and Magnan, Pierre and Gilard, Olivier. Pixel pitch and particle energy influence on the dark current distribution of neutron irradiated CMOS image sensors. (2016) Optics Express, 24 (4). 4299-4315. ISSN 1094-4087

Goiffon, Vincent and Corbière, Franck and Rolando, Sébastien and Estribeau, Magali and Magnan, Pierre and Avon, Barbara and Baer, Jérémy and Gaillardin, Marc and Molina, Romain and Paillet, Philippe and Girard, Sylvain and Chabane, Aziouz and Cervantes, Paola and Marcandella, Claude. Multi-MGy Radiation Hard CMOS Image Sensor: Design, Characterization and X/Gamma Rays Total Ionizing Dose Tests. (2015) IEEE Transactions on Nuclear Science, 62 (6). 2956-2964. ISSN 0018-9499

Marcelot, Olivier and Goiffon, Vincent and Raine, Mélanie and Duhamel, Olivier and Gaillardin, Marc and Molina, Romain and Magnan, Pierre. Radiation Effects in CCD on CMOS Devices: First Analysis of TID and DDD Effects. (2015) IEEE Transactions on Electron Devices, 62 (6). 2965-2970. ISSN 0018-9383

Gaillardin, Marc and Martinez, Martial and Girard, Sylvain and Goiffon, Vincent and Paillet, Philippe and Leray, Jean-Luc and Magnan, Pierre and Ouerdane, Youcef and Boukenter, Aziz and Marcandella, Claude and Duhamel, Olivier and Raine, Mélanie and Richard, Nicolas and Andrieu, François and Barraud, Sylvain and Faynot, Olivier. High Total Ionizing Dose and Temperature Effects on Micro- and Nano-Electronic Devices. (2015) IEEE Transactions on Nuclear Science, 62 (3). 1226-1232. ISSN 0018-9499

Pelamatti, Alice and Belloir, Jean-Marc and Messien, Camille and Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre and Virmontois, Cédric and Saint-Pé, Olivier and Philippe, Paillet. Temperature dependence and dynamic behaviour of full well capacity in pinned photodiode CMOS image sensors. (2015) IEEE Transactions on Electron Devices, 62 (4). 1200-1207. ISSN 0018-9383

Goiffon, Vincent and Estribeau, Magali and Michelot, Julien and Cervantes, Paola and Pelamatti, Alice and Marcelot, Olivier and Magnan, Pierre. Pixel Level Characterization of Pinned Photodiode and Transfer Gate Physical Parameters in CMOS Image Sensors. (2014) IEEE Journal of the Electron Devices Society, 2 (4). 65-76. ISSN 2168-6734

Marcelot, Olivier and Estribeau, Magali and Goiffon, Vincent and Martin-Gonthier, Philippe and Corbière, Franck and Molina, Romain and Rolando, Sébastien and Magnan, Pierre. Study of CCD Transport on CMOS Imaging Technology: Comparison Between SCCD and BCCD, and Ramp Effect on the CTI. (2014) IEEE Transactions on Electron Devices, 61 (3). 844-849. ISSN 0018-9383

Raine, Mélanie and Goiffon, Vincent and Paillet, Philippe and Duhamel, Olivier and Girard, Sylvain and Gaillardin, Marc and Virmontois, Cédric and Belloir, Jean-Marc and Richard, Nicolas and Magnan, Pierre. Exploring the Kinetics of Formation and Annealing of Single Particle Displacement Damage in Microvolumes of Silicon. (2014) IEEE Transactions on Nuclear Science, 61 (6). 2826-2833. ISSN 0018-9499

Goiffon, Vincent and Estribeau, Magali and Cervantes, Paola and Molina, Romain and Gaillardin, Marc and Magnan, Pierre. Influence of Transfer Gate Design and Bias on the Radiation Hardness of Pinned Photodiode CMOS Image Sensors. (2014) IEEE Transactions on Nuclear Science, 61 (6). 3290-3301. ISSN 0018-9499

Virmontois, Cédric and Toulemont, Arthur and Rolland, Guy and Materne, Alex and Lalucaa, Valerian and Goiffon, Vincent and Codreanu, Catalin and Durnez, Clémentine and Bardoux, Alain. Radiation-Induced Dose and Single Event Effects in Digital CMOS Image Sensors. (2014) IEEE Transactions on Nuclear Science, 61 (6). 3331-3340. ISSN 0018-9499

Virmontois, Cédric and Goiffon, Vincent and Robbins, Mark S. and Tauziède, Laurie and Geoffray, Hervé and Raine, Mélanie and Girard, Sylvain and Gilard, Olivier and Magnan, Pierre and Bardoux, Alain. Dark Current Random Telegraph Signals in Solid-State Image Sensors. (2013) IEEE Transactions on Nuclear Science, 60 (6). 4323-4331. ISSN 0018-9499

Raine, Mélanie and Goiffon, Vincent and Girard, Sylvain and Rousseau, Adrien and Gaillardin, Marc and Paillet, Philippe and Duhamel, Olivier and Virmontois, Cédric. Modeling Approach for the Prediction of Transient and Permanent Degradations of Image Sensors in Complex Radiation Environments. (2013) IEEE Transactions on Nuclear Science, 60 (6). 4297-4304. ISSN 0018-9499

Lalucaa, Valerian and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Rolland, Guy and Petit, Sophie. Single Event Effects in 4T Pinned Photodiode Image Sensors. (2013) IEEE Transactions on Nuclear Science, 60 (6). 4314 -4322. ISSN 0018-9499

Gaillardin, Marc and Girard, Sylvain and Paillet, Philippe and Leray, Jean-Luc and Goiffon, Vincent and Magnan, Pierre and Marcandella, Claude and Martinez, Martial and Raine, Mélanie and Duhamel, Olivier and Richard, Nicolas and Andrieu, François and Barraud, Sylvain and Faynot, Olivier. Investigations on the vulnerability of advanced CMOS technologies to MGy dose environments. (2013) IEEE Transactions on Nuclear Science, 60 (4). 2590-2597. ISSN 0018-9499

Gaillardin, Marc and Goiffon, Vincent and Marcandella, Claude and Girard, Sylvain and Martinez, Martial and Paillet, Philippe and Magnan, Pierre and Estribeau, Magali. Radiation Effects in CMOS Isolation Oxides: Differences and Similarities With Thermal Oxides. (2013) IEEE Transactions on Nuclear Science, 60 (4). 2623-2629. ISSN 0018-9499

Pelamatti, Alice and Goiffon, Vincent and Estribeau, Magali and Cervantes, Paola and Magnan, Pierre. Estimation and Modeling of the Full Well Capacity in Pinned Photodiode CMOS Image Sensors. (2013) IEEE Electron Device Letters, 34 (7). 900-902. ISSN 0741-3106

Gaillardin, Marc and Goiffon, Vincent and Magnan, Pierre. High total ionizing dose and temperature effects on micro- and nano-electronic devices. (2013) Proceedings of Advancements in Nuclear Instrumentation Measurement Methods and their Applications (ANIMMA), 2013 3rd International Conference on. 1-6.

Lalucaa, Valerian and Goiffon, Vincent and Magnan, Pierre and Rolland, Guy and Petit, Sophie. Single Event Effects in CMOS Image Sensors. (2013) IEEE Transactions on Nuclear Science, 60 (4). 2494-2502. ISSN 0018-9499

Girard, Sylvain and Mescia, Luciano and Vivona, Marilena and Laurent, Arnaud and Ouerdane, Youcef and Marcandella, Claude and Prudenzano, Francesco and Boukenter, Aziz and Robin, Thierry and Paillet, Philippe and Goiffon, Vincent and Gaillardin, Marc and Cadier, Benoît and Pinsard, Emmanuel and Cannas, Marco and Boscaino, Roberto. Design of Radiation-Hardened Rare-Earth Doped Amplifiers Through a Coupled Experiment/Simulation Approach. (2013) Journal of Lightwave Technology (JLT), 31 (8). 1247-1254. ISSN 0733-8724

Paillet, Philippe and Goiffon, Vincent and Chabane, Aziouz and Girard, Sylvain and Rousseau, Adrien and Darbon, Stéphane and Duhamel, Olivier and Raine, Mélanie and Cervantes, Paola and Gaillardin, Marc and Bourgade, Jean-Luc and Magnan, Pierre and Glebov, Vladimir Yu and Pien, Gregory. Hardening approach to use CMOS image sensors for fusion by inertial confinement diagnostics. (2013) IEEE Transactions on Nuclear Science, 60 (6). 4349-4355. ISSN 0018-9499

Rolando, Sébastien and Goiffon, Vincent and Magnan, Pierre and Corbière, Franck and Molina, Romain and Tulet, Michel and Bréart-de-Boisanger, Michel and Saint-Pé, Olivier and Guiry, Saïprasad and Larnaudie, Franck and Leone, Bruno and Perez-Cuevas, Leticia and Zayer, Igor. Smart CMOS image sensor for lightning detection and imaging. (2013) Applied Optics, 52 (7). C16-C23. ISSN 0003-6935

Place, Sébastien and Carrere, Jean-Pierre and Allegret, Stephane and Magnan, Pierre and Goiffon, Vincent and Roy, François. Rad Tolerant CMOS Image Sensor Based on Hole Collection 4T Pixel Pinned Photodiode. (2012) IEEE Transactions on Nuclear Science, 59 (6). 2888-2893. ISSN 0018-9499

Goiffon, Vincent and Girard, Sylvain and Paillet, Philippe and Magnan, Pierre and Chabane, Aziouz and Rousseau, Adrien and Darbon, Stéphane and Cervantes, Paola and Bourgade, Jean-Luc. Mitigation technique for use of CMOS image sensors in megajoule class laser radiative environment. (2012) IEEE Electronics Letters , 48 (21). 1338-1339. ISSN 0013-5194

Place, Sébastien and Carrere, Jean-Pierre and Allegret, Stephane and Magnan, Pierre and Goiffon, Vincent and Roy, François. Radiation Effects on CMOS Image Sensors With Sub-2 µm Pinned Photodiodes. (2012) IEEE Transactions on Nuclear Science, 59 (4). 909-917. ISSN 0018-9499

Virmontois, Cédric and Goiffon, Vincent and Corbière, Franck and Magnan, Pierre and Girard, Sylvain and Bardoux, Alain. Displacement Damage Effects in Pinned Photodiode CMOS Image Sensors. (2012) IEEE Transactions on Nuclear Science, 59 (6). 2872-2877. ISSN 0018-9499

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Place, Sébastien and Gaillardin, Marc and Girard, Sylvain and Paillet, Philippe and Estribeau, Magali and Martin-Gonthier, Philippe. Identification of radiation induced dark current sources in pinned photodiode CMOS image sensors. (2012) IEEE Transactions on Nuclear Science, 59 (4). 918-926. ISSN 0018-9499

Martin-Gonthier, Philippe and Goiffon, Vincent and Magnan, Pierre. In-Pixel source follower transistor RTS noise behavior under ionizing radiation in CMOS image sensors. (2012) IEEE Transactions on Electron Devices, 59 (6). 1686-1692. ISSN 0018-9383

Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Magnan, Pierre and Gaillardin, Marc and Virmontois, Cédric and Martin-Gonthier, Philippe and Molina, Romain and Corbière, Franck and Girard, Sylvain and Paillet, Philippe and Marcandella, Claude. Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose. (2012) IEEE Transactions on Nuclear Science, 59 (6). 2878-2887. ISSN 0018-9499

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Saint-Pé, Olivier and Petit, Sophie and Rolland, Guy and Bardoux, Alain. Similarities Between Proton and Neutron Induced Dark Current Distribution in CMOS Image Sensors. (2012) IEEE Transactions on Nuclear Science, 59 (4). 927-936. ISSN 0018-9499

Goiffon, Vincent and Girard, Sylvain and Magnan, Pierre and Chabane, Aziouz and Paillet, Philippe and Cervantes, Paola and Martin-Gonthier, Philippe and Baggio, Jacques and Estribeau, Magali and Bourgade, Jean-Luc and Darbon, Stéphane and Rousseau, Adrien and Glebov, Vladimir Yu and Pien, Gregory and Sangster, Thomas C.. Vulnerability of CMOS image sensors in megajoule class laser harsh environment. (2012) Optics Express, 20 (18). 20028-20042. ISSN 1094-4087

Goiffon, Vincent and Cervantes, Paola and Virmontois, Cédric and Corbière, Franck and Magnan, Pierre and Estribeau, Magali. Generic radiation hardened photodiode layouts for deep submicron CMOS image sensor processes. (2011) IEEE Transaction on Nuclear Sciences (99). ISSN 0018-9499

Gaillardin, Marc and Goiffon, Vincent and Girard, Sylvain and Martinez, Martial and Magnan, Pierre and Paillet, Philippe. Enhanced Radiation-Induced Narrow Channel Effects in Commercial 0.18 μm Bulk Technology. (2011) IEEE Transactions on Nuclear Science, 58 (p. 6). 2807-2815. ISSN 0018-9499

Goiffon, Vincent and Magnan, Pierre and Martin-Gonthier, Philippe and Virmontois, Cédric and Gaillardin, Marc. Evidence of a novel source of random telegraph signal in CMOS image sensors. (2011) IEEE Electron Device Letters, 32 (6). 773-775. ISSN 0741-3106

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Girard, Sylvain and Petit, Sophie and Rolland, Guy and Bardoux, Alain. Total ionizing dose versus displacement damage dose induced dark current random telegraph signals in CMOS image sensors. (2011) IEEE Transactions on Nuclear Science, 58 (6). 3085-3094. ISSN 0018-9499

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Girard, Sylvain and Paillet, Philippe. Analysis of total dose-induced dark current in CMOS image sensors from interface state and trapped charge density measurements. (2010) IEEE Transactions on Nuclear Science, 57 (6). 3087-3094. ISSN 0018-9499

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Inguimbert, Christophe and Petit, Sophie and Rolland, Guy and Saint-Pé, Olivier. Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology. (2010) IEEE Transactions on Nuclear Science, 57 (6). 3101-3108. ISSN 0018-9499

Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre. Overview of ionizing radiation effects in image sensors fabricated in a deep-submicrometer CMOS imaging technology. (2009) IEEE Transactions on Electron Devices, 5 (11). 2594 -2601. ISSN 0018-9383

Goiffon, Vincent and Hopkinson, Gordon R. and Magnan, Pierre and Bernard, Frédéric and Rolland, Guy and Saint-Pé, Olivier. Multilevel RTS in proton irradiated CMOS image sensors manufactured in a deep submicron technology. (2009) IEEE Transactions on Nuclear Science, 5 (4). 2132-2141 . ISSN 0018-9499

Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Bernard, Frédéric and Rolland, Guy. Ionization versus displacement damage effects in proton irradiated CMOS sensors manufactured in deep submicron process. (2009) Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment, 610 (1). 225-229. ISSN 0168-9002

Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Bernard, Frédéric and Rolland, Guy. Total dose evaluation of deep submicron CMOS imaging technology through elementary device and pixel array behavior analysis. (2008) IEEE Transactions on Nuclear Science, 5 (6). 3494-3501. ISSN 0018-9499

Hopkinson, Gordon R. and Goiffon, Vincent and Mohammadzadeh, Ali. Random telegraph signals in proton irradiated CCDs and APS. (2008) IEEE Transactions on Nuclear Science, (4). 2197-2204. ISSN 0018-9499

Conference or Workshop Item

Jay, Antoine and Hemeryck, Anne and Cristiano, Fuccio and Rideau, Denis and Julliard, Pierre-Louis and Goiffon, Vincent and Le Roch, Alexandre and Martin-Samos, Layla and Gironcoli, Stefano De and Richard, Nicolas. Clusters of Defects as a Possible Origin of Random Telegraph Signal in Imager Devices: a DFT based Study. (2021) In: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 27 September 2021 - 29 September 2021 (Dallas, United States).

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Goiffon, Vincent. Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Floating Diffusions. (2019) In: 2018 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2018), 16 July 2018 - 20 July 2018 (Kona, United States).

Dewitte, Hugo and Rizzolo, Serena and Paillet, Philippe and Magnan, Pierre and Le Roch, Alexandre and Corbière, Franck and Molina, Romain and Girard, Sylvain and Allanche, Timothé and Muller, Cyprien and Desjonquères, Hortense and Macé, Jean Reynald and Baudu, Jean-Pierre and Saravia Flores, A. and Goiffon, Vincent. Annealing Effects on Radiation Hardened CMOS Image Sensors Exposed to Ultra High Total Ionizing Doses. (2019) In: Radiation and its Effects on Components and Systems - RADECS 2019, 16 September 2019 - 20 September 2019 (Montpellier, France).

Goiffon, Vincent and Allanche, Timothé and Muller, Cyprien and Girard, Sylvain and Paillet, Philippe and Macé, Jean Reynald and Osmond, Melanie and Burnichon, Pierre and Plumeri, Stéphane and Baudu, Jean-Pierre and Boukenter, Aziz and Magnan, Pierre and Rizzolo, Serena and Corbière, Franck and Duhamel, Olivier and Rousson, johanna and Desjonquères, Hortense and Molina, Romain and Ouerdane, Youcef and Lépine, Thierry. CAMRAD: Development of a Multi-Megagray Radiation Hard CMOS Camera for Dismantling Operations. (2018) In: Dismantling Challenges: Industrial Reality, Prospects and Feedback Experience (DEM 2018), 22 October 2018 - 24 October 2018 (Avignon, France).

Muller, Cyprien and Allanche, Timothé and Paillet, Philippe and Duhamel, Olivier and Goiffon, Vincent and Rizzolo, Serena and Lépine, Thierry and Ouerdane, Youcef and Boukenter, Aziz and Girard, Sylvain. Radiation Effects on the Photometric Budget of a MGy Radiation-Hardened Camera. (2018) In: Radiation Effects on Components and Systems Conference (RADECS), 16 September 2018 - 21 September 2018 (Gothenburg, Sweden). (Unpublished)

Rizzolo, Serena and Goiffon, Vincent and Corbière, Franck and Molina, Romain and Chabane, Aziouz and Girard, Sylvain and Paillet, Philippe and Magnan, Pierre and Boukenter, Aziz and Allanche, Timothé and Muller, Cyprien and Monsanglant-Louvet, Celine and Osmond, Melanie and Desjonquères, Hortense and Macé, Jean Reynald and Burnichon, Pierre and Baudu, Jean-Pierre and Plumeri, Stéphane. Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels. (2018) In: Radiation Effects on Optoelectronic Detectors (CNES Workshop), 27 November 2018 (Toulouse, France). (Unpublished)

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Magnan, Pierre and Goiffon, Vincent. Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions. (2018) In: IEEE Nuclear and Space Radiation Effects Conference (NSREC 2018), 16 July 2018 - 20 July 2018 (Kona, United States).

Raine, Mélanie and Jay, Antoine and Richard, Nicolas and Goiffon, Vincent and Girard, Sylvain and Gaillardin, Marc and Paillet, Philippe. Simulation of Single Particle Displacement Damage in Silicon – Part I: Global Approach and Primary Interaction Simulation. (2017) In: Nuclear and Space Radiation Effects Conference (NSREC), 11 July 2016 - 15 July 2016 (Portland, United States).

Allanche, Timothé and Goiffon, Vincent and Rizzolo, Serena and Paillet, Philippe and Chabane, Aziouz and Duhamel, Olivier and Muller, Cyprien and Magnan, Pierre and Clerc, Raphael and Marin, Emmanuel and Boukenter, Aziz and Ouerdane, Youcef and Girard, Sylvain. Analysis of X-Ray Photo-Charge Induced Speckles in a Radiation Hardened CMOS Image Sensor. (2017) In: Radiation and Its Effects on Components and Systems (RADECS 2017), 2 October 2017 - 6 October 2017 (Genève, Switzerland).

Goiffon, Vincent and Rizzolo, Serena and Corbière, Franck and Rolando, Sébastien and Chabane, Aziouz and Sergent, Marius and Paillet, Philippe and Girard, Sylvain and Estribeau, Magali and Magnan, Pierre and Van Uffelen, Marco and Mont Casellas, Laura and Gaillardin, Marc and Scott, Robin and De Cock, Wouter. Challenges in Improving the Performances of Radiation Hard CMOS Image Sensors for Gigarad (Grad) Total Ionizing Dose. (2017) In: 2017 International Image Sensor Workshop (IISW), 30 May 2017 - 2 June 2017 (Hiroshima, Japan).

Girard, Sylvain and Goiffon, Vincent and Paillet, Philippe and Van Uffelen, Marco and Mont Casellas, Laura and Corbière, Franck and Rolando, Sébastien and Rizzolo, Serena and Magnan, Pierre and Duhamel, Olivier and Marcandella, Claude and Gaillardin, Marc and Allanche, Timothé and Muller, Cyprien and Lépine, Thierry and Boukenter, Aziz and Ouerdane, Youcef and Scott, Robin and De Cock, Wouter. FURHIS project: Development of MGy Radiation‐Hardened Imaging System for ITER remote handling operations. (2017) In: International Conference on Advancements in Nuclear Instrumentation Measurement Methods and their Applications (ANIMMA 2017), 19 June 2017 - 23 June 2017 (Lièges, Belgium).

Durnez, Clémentine and Goiffon, Vincent and Rizzolo, Serena and Magnan, Pierre and Virmontois, Cédric and Rubaldo, Laurent. Localization of Dark Current Random Telegraph Signal sources in pinned photodiode CMOS Image Sensors. (2017) In: 2017 International Conference on Noise and Fluctuations (ICNF), 20 June 2017 - 23 June 2017 (Vilnius, Lithuania).

Rizzolo, Serena and Goiffon, Vincent and Sergent, Marius and Corbière, Franck and Rolando, Sébastien and Chabane, Aziouz and Paillet, Philippe and Marcandella, Claude and Girard, Sylvain and Magnan, Pierre and Van Uffelen, Marco and Mont Casellas, Laura and Scott, Robin and De Cock, Wouter. Multi-MGy total ionizing dose induced MOSFET variability effects on radiation hardened CMOS image sensor performances. (2017) In: Radiations Effects on Components and Systems (RADECS), 2 October 2017 - 6 October 2017 (Geneva, Switzerland).

Le Roch, Alexandre and Goiffon, Vincent and Durnez, Clémentine and Magnan, Pierre and Virmontois, Cédric and Pistre, L. and Belloir, Jean-Marc. Radiation Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Application. (2017) In: RADECS 2017 : Radiation and Its Effects on Components and Systems, 2 October 2017 - 6 October 2017 (Geneva, Switzerland). (Unpublished)

Le Roch, Alexandre and Goiffon, Vincent and Durnez, Clémentine and Magnan, Pierre and Virmontois, Cédric and Pistre, L. and Belloir, Jean-Marc. Radiation-Induced Defects in a Commercial Image Sensor for Space Applications. (2017) In: CNES Workshop: CMOS Image Sensors for High Performance Applications, 21 November 2017 - 22 November 2017 (Toulouse, France). (Unpublished)

Belloir, Jean-Marc and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Gilard, Olivier and Raine, Mélanie and Paillet, Philippe. Dark Current Spectroscopy in neutron, proton and ion irradiated CMOS Image Sensors. (2016) In: IEEE Nuclear and Space Radiation Effects Conference (NSREC 2016), 11 July 2016 - 15 July 2016 (Portland, United States).

Rizzolo, Serena and Goiffon, Vincent and Corbière, Franck and Rolando, Sébastien and Chabane, Aziouz and Baer, Jérémy and Estribeau, Magali and Magnan, Pierre and Marcelot, Olivier and Girard, Sylvain and Allanche, Timothé and Paillet, Philippe and Gaillardin, Marc and Marcandella, Claude and Van Uffelen, Marco and Mont Casellas, Laura and Scott, Robin. Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Grad Total Ionizing Dose Environments. (2016) In: Radiation Effects on Optoelectronic Detectors (CNES Workshop), 16 September 2016 (Toulouse, France).

Goiffon, Vincent and Corbière, Franck and Rolando, Sébastien and Estribeau, Magali and Avon, Barbara and Magnan, Pierre and Baer, Jérémy and Molina, Romain and Chabane, Aziouz and Cervantes, Paola and Gaillardin, Marc and Paillet, Philippe and Marcandella, Claude and Girard, Sylvain. Multi-MGy Radiation Hardened CMOS Image Sensor: Design, Characterization and X/Gamma Rays Total Ionizing Dose Tests. (2015) In: Proceedings of Nuclear and Space Radiation Effects Conference (NSREC), 13 July 2015 - 17 July 2015 (Boston, United States).

Belloir, Jean-Marc and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Gilard, Olivier and Raine, Mélanie and Paillet, Philippe. Dark Current Spectroscopy on Alpha Irradiated Pinned Photodiode CMOS Image Sensors. (2015) In: 15th European Conference RADECS 2015, 14 September 2015 - 18 September 2015 (Moscou, Russian Federation).

Pelamatti, Alice and Goiffon, Vincent and Chabane, Aziouz and Magnan, Pierre and Virmontois, Cédric and Saint-Pé, Olivier and Bréart-de-Boisanger, Michel. Speed Analysis in Pinned Photodiode CMOS Image Sensors based on a Pulsed Storage-Gate Method. (2015) In: Proceedings of European Solid-State Device conference (ESSDERC), 15 September 2015 - 17 September 2015 (Gratz, Austria).

Belloir, Jean-Marc and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Gilard, Olivier and Raine, Mélanie and Paillet, Philippe and Duhamel, Olivier and Gaillardin, Marc. Pixel Pitch and Particle Energy Influence on the Dark Current Distribution of Neutron Irradiated CMOS Image Sensors. (2015) In: IEEE Nuclear & Space Radiation Effects Conference (NSREC 2015), 13 July 2015 - 17 July 2015 (Boston, United States).

Goiffon, Vincent and Corbière, Franck and Rolando, Sébastien and Estribeau, Magali and Magnan, Pierre and Avon, Barbara and Baer, Jérémy and Gaillardin, Marc and Paillet, Philippe and Girard, Sylvain and Molina, Romain and Chabane, Aziouz and Cervantes, Paola and Marcandella, Claude. Toward Multi-MGy / Grad Radiation Hardened CMOS Image sensors for Nuclear Applications. (2015) In: International Image Sensor Workshop (IISW 2015), 8 June 2015 - 11 June 2015 (Vaals, Netherlands).

Gaillardin, Marc and Goiffon, Vincent and Paillet, Philippe and Raine, Mélanie and Girard, Sylvain and Leray, Jean-Luc and Magnan, Pierre and Ouerdane, Youcef and Boukenter, Aziz and Martinez, Martial and Marcandella, Claude and Duhamel, Olivier and Richard, Nicolas. Investigations of MGy ionizing dose effects induced in thin oxides of micro-electronic devices. (2015) In: Advancements in Nuclear Instrumentation Measurement Methods and their Applications (ANIMMA2015), 20 April 2015 - 24 April 2015 (Lisbon, Portugal). (Unpublished)

Girard, Sylvain and Goiffon, Vincent and Paillet, Philippe and Lépine, Thierry and Corbière, Franck and Rolando, Sébastien and Boukenter, Aziz and Alanche, Timothé and Duhamel, Olivier and Molina, Romain and Estribeau, Magali and Avon, Barbara and Baer, Jérémy and Gaillardin, Marc and Raine, Mélanie and Magnan, Pierre and Ouerdane, Youcef. Multi-MGy Radiation Hardened Camera for Nuclear Facilities. (2015) In: Proceedings of Advancements in Nuclear Instrumentation Measurement Methods and their Applications, 20 April 2015 - 24 April 2015 (Lisbon, Portugal).

Gaillardin, Marc and Goiffon, Vincent. TID Effects in CMOS and SOI - HBD vs HBT – application to MGy Hardening of a CMOS Imager. (2015) In: Advancements in Nuclear Instrumentation Measurement Methods and their Applications (ANIMMA2015), 20 April 2015 - 24 April 2015 (Lisbon, Portugal). (Unpublished)

Belloir, Jean-Marc and Goiffon, Vincent and Pelamatti, Alice and Lincelles, Jean-Baptiste and Virmontois, Cédric and Magnan, Pierre and Gilard, Olivier and Raine, Mélanie and Paillet, Philippe. Dark Current Blooming in Pinned Photodiode CMOS Image Sensors. (2015) In: CMOS Image sensors for high performance applications, 18 November 2015 - 19 November 2015 (Toulouse, France). (Unpublished)

Raine, Mélanie and Goiffon, Vincent and Paillet, Philippe and Duhamel, Olivier and Girard, Sylvain and Gaillardin, Marc and Virmontois, Cédric and Belloir, Jean-Marc and Richard, Nicolas and Magnan, Pierre. Exploring the Kinetics of Formation and Annealing of Single Particle Displacement Damage in Microvolumes of Silicon. (2014) In: IEEE Nuclear and Space Radiation Effects Conference (NSREC), 14 July 2014 - 18 July 2014 (Paris, France).

Goiffon, Vincent and Estribeau, Magali and Cervantes, Paola and Molina, Romain and Gaillardin, Marc and Magnan, Pierre. Influence of Transfer Gate Design and Bias on the Radiation Hardness of Pinned Photodiode CMOS Image Sensors. (2014) In: Proceedings of Nuclear and Space Radiation Effects Conference (NSREC) 2014, 14 July 2014 - 18 July 2014 (Paris, France). (Unpublished)

Belloir, Jean-Marc and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Gilard, Olivier and Raine, Mélanie and Paillet, Philippe. Validation of a model for Dark Current Non Uniformity generated by Displacement Damage Dose in irradiated CMOS Image Sensors. (2014) In: Workshop CNES : Radiation Effects on Optoelectronic Devices, 27 November 2014 (Toulouse, France). (Unpublished)

Goiffon, Vincent and Michelot, Julien and Magnan, Pierre and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Pelamatti, Alice and Martin-Gonthier, Philippe. On The Pixel Level Estimation of Pinning Voltage, Pinned Photodiode Capacitance and Transfer Gate Channel Potential. (2013) In: International Image Sensor Workshop (IISW 2013), 12 June 2013 - 16 June 2013 (Snowbird Resort, Utah, United States).

Rousseau, Adrien and Darbon, Stéphane and Paillet, Philippe and Girard, Sylvain and Bourgade, Jean-Luc and Raine, Mélanie and Duhamel, Olivier and Goiffon, Vincent and Magnan, Pierre and Chabane, Aziouz and Cervantes, Paola and Hamel, Matthieu and Larour, Jean. Nuclear background effects on plasma diagnostics for megajoule class laser facility. (2013) In: SPIE Optics+Photonics, 25 August 2013 - 29 August 2013 (San Diego, California, United States).

Lalucaa, Valerian and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Rolland, Guy and Petit, Sophie. Single Event Effects in 4T Pinned Photodiode Image Sensors. (2013) In: 50th IEEE Nuclear and Space Radiation Effects Conference (NSREC), 8 July 2013 - 12 July 2013 (San Francisco, United States).

Lalucaa, Valerian and Goiffon, Vincent and Magnan, Pierre and Rolland, Guy and Petit, Sophie. Single Event Effects in 4T and 5T Pinned Photodiode CMOS Image Sensors. (2013) In: 3rd Workshop on CMOS Image Sensors for High Performance Applications, 26 November 2013 - 27 November 2013 (Toulouse, France). (Unpublished)

Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Magnan, Pierre and Gaillardin, Marc and Virmontois, Cédric and Martin-Gonthier, Philippe and Molina, Romain and Corbière, Franck and Girard, Sylvain and Paillet, Philippe and Marcandella, Claude. Radiation Effects on Pinned Photodiode CMOS Image Sensors: Overview of Pixel Performance Degradation Due to Total Ionizing Dose. (2012) In: Workshop on Radiation Effects in Optoelectronic Detectors, 28 November 2012 - 29 November 2012 (Toulouse, France). (Unpublished)

Goiffon, Vincent and Magnan, Pierre and Martin-Gonthier, Philippe and Virmontois, Cédric and Gaillardin, Marc. New source of random telegraph signal in CMOS image sensors. (2012) In: International Image Sensor Workshop, 8 June 2011 - 11 June 2011 (Hokaido, Japan).

Rolando, Sébastien and Goiffon, Vincent and Magnan, Pierre and Tulet, Michel and Bréart-de-Boisanger, Michel and Saint-Pé, Olivier and Guiry, Saïprasad and Corbière, Franck and Molina, Romain and Larnaudie, Franck and Leone, Bruno and Perez-Cuevas, Leticia and Zayer, Igor. CMOS Image Sensor with on-chip Intelligence for Lightning Detection and Imaging. (2012) In: Imaging Systems and Applications (IS), 24 June 2012 - 28 June 2012 (Monterey, United States).

Lalucaa, Valerian and Goiffon, Vincent and Magnan, Pierre and Rolland, Guy and Petit, Sophie. Single Event Effects in CMOS Image Sensors. (2012) In: 2nd Workshop on Radiation Effects in Optoelectronic Detectors, 27 November 2012 - 29 November 2012 (Toulouse, France). (Unpublished)

Rousseau, Adrien and Darbon, Stéphane and Girard, Sylvain and Paillet, Philippe and Bourgade, Jean-Luc and Goiffon, Vincent and Magnan, Pierre and Lalucaa, Valerian and Hamel, Matthieu and Larour, Jean. Vulnerability of optical detection systems to megajoule class laser radiative environment. (2012) In: SPIE Photonics Europe, 16 April 2012 - 19 April 2012 (Brussels, Belgium).

Goiffon, Vincent and Cervantes, Paola and Virmontois, Cédric and Corbière, Franck and Magnan, Pierre and Estribeau, Magali. Generic radiation hardened photodiode layouts for deep submicron CMOS image sensor processes. (2011) In: 2011 IEEE Nuclear and Space Radiation Effects Conference (NSREC), 25 July 2011 - 29 July 2011 (Las Vegas, United States).

Girard, Sylvain and Mescia, Luciano and Vivona, Marilena and Laurent, Arnaud and Ouerdane, Youcef and Marcandella, Claude and Prudenzano, Francesco and Boukenter, Aziz and Robin, Thierry and Paillet, Philippe and Goiffon, Vincent and Cadier, Benoît and Cannas, Marco and Boscaino, Roberto. Coupled experiment/simulation approach for the design of radiation-hardened rare-earth doped optical fibers and amplifiers. (2011) In: 12th European Conference Radiation and Its Effects on Components and Systems (RADECS), 19-23 Sept 2011, Sevilla, Spain .

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Gaillardin, Marc and Girard, Sylvain and Paillet, Philippe and Martin-Gonthier, Philippe. Identification of radiation induced dark current sources in pinned photodiode CMOS image sensors. (2011) In: Radiation Effects on Components and Systems Conference, 19-23 Sept. 2011, Sevilla, Spain .

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Saint-Pé, Olivier and Petit, Sophie and Rolland, Guy. Influence of Displacement Damage Dose on Dark Current Distribution of Irradiated CMOS Image Sensors. (2011) In: 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2011), 19 September 2011 - 23 September 2011 (Sevilla, Spain).

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre. Investigation of dark current random telegraph signal in pinned photodiode CMOS image sensors. (2011) In: IEEE International Electron Devices Meeting (IEDM 2011), 05-07 Dec 2011, Washington, USA .

Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Cervantes, Paola and Corbière, Franck and Estribeau, Magali. Radiation Damages in CMOS Active Pixel Sensors. (2011) In: OSA Imaging Systems and Applications, 10 July 2011 - 14 July 2011 (Toronto, Canada).

Place, Sébastien and Carrere, Jean-Pierre and Magnan, Pierre and Goiffon, Vincent and Roy, François. Radiation effects on CMOS image sensors with sub-2µm pinned photodiodes. (2011) In: 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2011, 19-23 Sept 2011, Sevilla, Spain .

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Girard, Sylvain and Paillet, Philippe. Analysis of Total Dose Induced Dark Current in CMOS Image Sensors from Interface State and Trapped Charge Density Measurements. (2010) In: 2010 IEEE Nuclear and Space Radiation Effects Conference (NSREC), 19 July 2010 - 23 July 2010 (Denver, United States).

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Inguimbert, Christophe and Petit, Sophie and Rolland, Guy and Saint-Pé, Olivier. Displacement Damage Effect Due to Neutron and Proton Irradiations on CMOS Image Sensors Manufactured in Deep Sub-Micron Technology. (2010) In: 2010 IEEE Nuclear and Space Radiation Effects Conference (NSREC), 19 July 2010 - 23 July 2010 (Denver, United States).

Magnan, Pierre and Goiffon, Vincent. Ionization Effects in CMOS Imagers. (2010) In: Fraunhofer IMS Workshop on CMOS Imaging, 4 May 2010 - 5 May 2010 (Duisburg, Germany). (Unpublished)

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Corbière, Franck and Estribeau, Magali and Pinel, Philippe. Radiation damages in CMOS image sensors: testing and hardening challenges brought by deep sub-micrometer CIS processes. (2010) In: SPIE Remote Sensing, 20 - 23 Sept 2010, Toulouse, France .

Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Bernard, Frédéric and Rolland, Guy. Ionization versus displacement damage effects in proton irradiated CMOS sensor manufactured in deep submicron process. (2009) In: 5th International Conference on New Developments In Photodetection (NDIP08), 15 June 2008 - 20 June 2008 (Aix-les-Bains, France).

Virmontois, Cédric and Djité, Ibrahima and Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre. Proton and g-ray irradiation on deep sub-micron processed CMOS image sensor. (2009) In: International symposium on reliability of optoelectronics for space (ISROS 2009), 11-15 May 2009, 11 May 2009 - 15 May 2009, Cagliari, Italy (Italy).

Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre. Optoelectrical performance evolution of CMOS image sensors exposed to gamma radiation. (2009) In: International Image Sensor Workshop, 25-28 June 2009, Bergen, Norway .

Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Bernard, Frédéric and Rolland, Guy. Total Dose Evaluation of Deep Submicron CMOS Imaging Technology Through Elementary Device and Pixel Array Behavior Analysis. (2008) In: 2008 IEEE Nuclear and Space Radiation Effects Conference (NSREC), 14 July 2008 - 18 July 2008 (Tucson, United States).

Goiffon, Vincent and Hopkinson, Gordon R. and Magnan, Pierre and Bernard, Frédéric and Rolland, Guy and Saint-Pé, Olivier. Multi level RTS in proton irradiated CMOS image sensors manufactured in deep submicron technology. (2008) In: Radiation Effects on Components and Systems - RADECS, 10 September 2008 - 12 September 2008 (Jyväskylä, Finland).

Goiffon, Vincent and Magnan, Pierre and Bernard, Frédéric and Rolland, Guy and Saint-Pé, Olivier and Huger, Nicolas and Corbière, Franck. Ionizing radiation effects on CMOS imagers manufactured in deep submicron process. (2008) In: SPIE Electronic Imaging 2008 : Sensors, Cameras, and Systems for Industrial/Scientific Applications IX, 27-31 Jan 2008, San Jose, United States .

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Saint-Pé, Olivier and Petit, Sophie and Rolland, Guy and Bardoux, Alain. Influence of displacement damage dose on dark current distributions of irradiated CMOS image sensors. In: Radiation Effects on Components and Systems Conference, 19-23 Sept. 2011, Sevilla, Spain .

Invited Conference

Goiffon, Vincent. Hardening Techniques for Image Sensors. (2021) In: 2021 IEEE Nuclear and Space Radiation Effects Conference Short Course, 16 July 2021 - 23 July 2021 (United States).

Goiffon, Vincent. Tutorial on Radiation Effects on CMOS Image Sensors. (2021) In: RADOPT 2021: Workshop on Radiation Effects on Optoelectronics and Photonics Technologies, 15 November 2021 - 18 November 2021 (Saint-Etienne, France). (Unpublished)

Goiffon, Vincent. Experimental Study of Semiconductor Irradiation Defects by the Use of Image Sensors. (2020) In: Theory days 2020: Theory days on Multiscale Approaches applied to Irradiation Processes, 25 November 2020 - 26 November 2020 (France). (Unpublished)

Goiffon, Vincent. CMOS Image Sensors in Harsh Radiation Environments. (2016) In: TWEPP 2016 - Topical Workshop on Electronics for Particle Physics, 26 September 2016 - 30 September 2016 (Karlsruhe, Germany). (Unpublished)

Book Section

Goiffon, Vincent. Radiation Effects on CMOS Active Pixel Image Sensors. (2015) In: Ionizing Radiation Effects in Electronics: From Memories to Imagers. CRC Press Taylor and Francis Group, 295-332. ISBN 9781498722605

This list was generated on Thu Mar 28 09:34:35 2024 CET.