Flux publications Open Science ISAE-SUPAERO

Antonsanti, Aubin, Goiffon Vincent, Roy François, Le Roch Alexandre, Ryder, Landen, Malherbe Victor, Roche, Philippe, Nier, Olivier, Virmontois Cédric, Lauenstein, Jean-Marie, Ionizing Radiation Effects on Hole Collection Backside-Illuminated P-Type Deep-Trench Pinned Photo-MOS Pixels under Image Acquisition. 2023, IEEE Transactions on Nuclear Science. 70 (8). 1958 - 1965. ISSN 0018-9499

Ionizing Radiation Effects on Hole Collection Backside-Illuminated P-Type Deep-Trench Pinned Photo-MOS Pixels under Image Acquisition

Antonsanti, Aubin, Lauenstein, Jean-Marie, Le Roch Alexandre, Ryder, Landen, Virmontois Cédric, Goiffon Vincent, Exploring Space-Radiation Induced Dark Signal and Random-Telegraph-Signal in a Sony IMX219 CMOS Image-Sensor : Proceedings of the International Image Sensor Workshop 2023, Crieff, Scotland. 2023, IISW23 International Image Sensor Workshop 2023, 2023-05-25 - 2023-05-22 (2023-05-22, Crieff)

Exploring Space-Radiation Induced Dark Signal and Random-Telegraph-Signal in a Sony IMX219 CMOS Image-Sensor : Proceedings of the International Image

Cobo Elie, Massenot Sébastien, Le Roch Alexandre, Corbière Franck, Goiffon Vincent, Magnan Pierre, Pelouard Jean-Luc, Design of a CMOS image sensor pixel with embedded polysilicon nano-grating for near-infrared imaging enhancement. 2022, Applied Optics. 61 (4). 960-968. ISSN 1559-128X

Design of a CMOS image sensor pixel with embedded polysilicon nano-grating for near-infrared imaging enhancement

Antonsanti, Aubin, Virmontois Cédric, Lauenstein, Jean-Marie, Le Roch Alexandre, Dewitte Hugo, Goiffon Vincent, Probing Dark Current Random Telegraph Signal in a Small Pitch Vertically Pinned Photodiode CMOS Image Sensor after Proton Irradiation. 2022, IEEE Transactions on Nuclear Science. 69 (7). 1506 - 1514. ISSN 0018-9499

Probing Dark Current Random Telegraph Signal in a Small Pitch Vertically Pinned Photodiode CMOS Image Sensor after Proton Irradiation

Jay Antoine, Hémeryck Anne, Cristiano Fuccio, Rideau Denis, Julliard Pierre-Louis, Goiffon Vincent, Le Roch Alexandre, Martin-Samos Layla, Gironcoli Stefano De, Richard Nicolas, Clusters of Defects as a Possible Origin of Random Telegraph Signal in Imager Devices : a DFT based Study : 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD). 2021, 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2021-09-27 - 2021-09-29 (2021-09-29, Dallas)

Clusters of Defects as a Possible Origin of Random Telegraph Signal in Imager Devices: a DFT based Study : 2021 International Conference on Simulation

Goiffon Vincent, Bilba Teddy, Deladerriere Theo, Beaugendre Guillaume, Le Roch Alexandre, Dion Arnaud, Virmontois Cédric, Belloir Jean-Marc, Gaillardin Marc, Jay Antoine, Paillet Philippe, Radiation Induced Variable Retention Time in Dynamic Random Access Memories. 2020, IEEE Transactions on Nuclear Science. 67 (1). 1-13. ISSN 0018-9499

Radiation Induced Variable Retention Time in Dynamic Random Access Memories

Le Roch Alexandre, Virmontois Cédric, Paillet Philippe, Warner Jeffrey H., Belloir Jean-Marc, Magnan Pierre, Goiffon Vincent, Comparison of X-Ray and Electron Radiation Effects on Dark Current Non-Uniformity and Fluctuations in CMOS Image Sensors. 2020, IEEE Transactions on Nuclear Science. 67 (1). 268-277. ISSN 0018-9499

Comparison of X-Ray and Electron Radiation Effects on Dark Current Non-Uniformity and Fluctuations in CMOS Image Sensors

Dewitte Hugo, Rizzolo Serena, Paillet Philippe, Magnan Pierre, Le Roch Alexandre, Corbière Franck, Molina Romain, Girard Sylvain, Allanche Timothé, Muller Cyprien, Desjonquères Hortense, Macé Jean Reynald, Baudu Jean-Pierre, Flores A. Saravia, Goiffon Vincent, Annealing Effects on Radiation-Hardened CMOS Image Sensors Exposed to Ultrahigh Total Ionizing Doses. 2020, IEEE Transactions on Nuclear Science. 67 (7). 1284-1292. ISSN 0018-9499

Annealing Effects on Radiation-Hardened CMOS Image Sensors Exposed to Ultrahigh Total Ionizing Doses

Le Roch Alexandre, Virmontois Cédric, Paillet Philippe, Belloir Jean-Marc, Rizzolo Serena, Marcelot Olivier, Dewitte Hugo, Van Uffelen Marco, Mont-Casellas Laura, Magnan Pierre, Goiffon Vincent, Phosphorus Versus Arsenic : Role of the Photodiode Doping Element in CMOS Image Sensor Radiation-Induced Dark Current and Random Telegraph Signal. 2020, IEEE Transactions on Nuclear Science. 67 (7). 1241-1250. ISSN 0018-9499

Phosphorus Versus Arsenic: Role of the Photodiode Doping Element in CMOS Image Sensor Radiation-Induced Dark Current and Random Telegraph Signal

Rizzolo Serena, Le Roch Alexandre, Marcelot Olivier, Corbière Franck, Paillet Philippe, Gaillardin Marc, Magnan Pierre, Goiffon Vincent, High Displacement Damage Dose Effects in Radiation Hardened CMOS Image Sensors. 2020, IEEE Transactions on Nuclear Science. 67 (7). 1256-1262. ISSN 0018-9499

High Displacement Damage Dose Effects in Radiation Hardened CMOS Image Sensors

Le Roch Alexandre, Virmontois Cédric, Paillet Philippe, Belloir Jean-Marc, Rizzolo Serena, Pace Federico, Durnez Clémentine, Magnan Pierre, Goiffon Vincent, Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions. 2019, IEEE Transactions on Nuclear Science. 66 (3). 616-624. ISSN 0018-9499

Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions

Le Roch Alexandre, Virmontois Cédric, Paillet Philippe, Belloir Jean-Marc, Rizzolo Serena, Pace Federico, Durnez Clémentine, Goiffon Vincent, Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Floating Diffusions. 2019, 2018 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2018), 2018-07-16 - 2018-07-20 (2018-07-20, Kona)

Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Floating Diffusions

Dewitte Hugo, Rizzolo Serena, Paillet Philippe, Magnan Pierre, Le Roch Alexandre, Corbière Franck, Molina Romain, Girard Sylvain, Allanche Timothé, Muller Cyprien, Desjonquères Hortense, Macé Jean Reynald, Baudu Jean-Pierre, Saravia Flores A., Goiffon Vincent, Annealing Effects on Radiation Hardened CMOS Image Sensors Exposed to Ultra High Total Ionizing Doses. 2019, Radiation and its Effects on Components and Systems - RADECS 2019, 2019-09-16 - 2019-09-20 (2019-09-20, Montpellier)

Annealing Effects on Radiation Hardened CMOS Image Sensors Exposed to Ultra High Total Ionizing Doses

Le Roch Alexandre, Virmontois Cédric, Goiffon Vincent, Tauziède Laurie, Belloir Jean-Marc, Durnez Clémentine, Magnan Pierre, Radiation-Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Applications. 2018, IEEE Transactions on Nuclear Science. 65 (8). 1645-1653. ISSN 0018-9499

Radiation-Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Applications

Durnez Clémentine, Goiffon Vincent, Virmontois Cédric, Rizzolo Serena, Le Roch Alexandre, Magnan Pierre, Paillet Philippe, Marcandella Claude, Rubaldo Laurent, Total Ionizing Dose Radiation-Induced Dark Current Random Telegraph Signal in Pinned Photodiode CMOS Image Sensors. 2018, IEEE Transactions on Nuclear Science. 65 (1). 92-100. ISSN 0018-9499

Total Ionizing Dose Radiation-Induced Dark Current Random Telegraph Signal in Pinned Photodiode CMOS Image Sensors

Le Roch Alexandre, Virmontois Cédric, Paillet Philippe, Belloir Jean-Marc, Rizzolo Serena, Pace Federico, Durnez Clémentine, Magnan Pierre, Goiffon Vincent, Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions. 2018, IEEE Nuclear and Space Radiation Effects Conference (NSREC 2018), 2018-07-16 - 2018-07-20 (2018-07-20, Kona)

Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions

Le Roch Alexandre, Goiffon Vincent, Durnez Clémentine, Magnan Pierre, Virmontois Cédric, Pistre L., Belloir Jean-Marc, Radiation-Induced Defects in a Commercial Image Sensor for Space Applications. 2017, CNES Workshop : CMOS Image Sensors for High Performance Applications, 2017-11-21 - 2017-11-22 (2017-11-22, Toulouse)

Radiation-Induced Defects in a Commercial Image Sensor for Space Applications

Le Roch Alexandre, Goiffon Vincent, Durnez Clémentine, Magnan Pierre, Virmontois Cédric, Pistre L., Belloir Jean-Marc, Radiation Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Application. 2017, RADECS 2017 : Radiation and Its Effects on Components and Systems, 2017-10-02 - 2017-10-06 (2017-10-06, Geneva)

Radiation Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Application

Jay, Antoine, Hémeryck, Anne, Richard, Nicolas, Martin-Samos, Layla, Raine, Melanie, Le Roch, Alexandre, Mousseau, Normand, Goiffon, Vincent, Paillet, Philippe, Gaillardin, Marc, Magnan, Pierre, Simulation of Single Particle Displacement Damage in Silicon – Part III : First Principles Characterization of Defect Properties

Simulation of Single Particle Displacement Damage in Silicon – Part III: First Principles Characterization of Defect Properties

Le Roch, Alexandre, Virmontois, Cedric, Paillet, Philippe, Warner, Jeffrey H., Belloir, Jean-Marc, Magnan, Pierre, Goiffon, Vincent, Comparison of X-Ray and Electron Radiation Effects on Dark Current Non-Uniformity and Fluctuations in CMOS Image Sensors

Comparison of X-Ray and Electron Radiation Effects on Dark Current Non-Uniformity and Fluctuations in CMOS Image Sensors

Le Roch, Alexandre, Virmontois, Cédric, Paillet, Philippe, Belloir, Jean-Marc, Rizzolo, Serena, Pace, Federico, Durnez, Clémentine, Magnan, Pierre, Goiffon, Vincent, Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions

Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions

Dewitte, Hugo, Rizzolo, Serena, Paillet, Philippe, Magnan, Pierre, Le Roch, Alexandre, Corbiere, Franck, Molina, Romain, Girard, Sylvain, Allanche, Timothé, Muller, Cyprien, Desjonqueres, Hortense, Mace, Jean-Reynald, Baudu, Jean-Pierre, Saravia Flores, Alvaro, Goiffon, Vincent, Annealing effects on Radiation Hardened CMOS Image Sensors Exposed to Ultra High Total Ionizing Doses

Annealing effects on Radiation Hardened CMOS Image Sensors Exposed to Ultra High Total Ionizing Doses

Le Roch, Alexandre, Virmontois, Cédric, Paillet, Philippe, Belloir, Jean-Marc, Rizzolo, Serena, Pace, Federico, Durnez, Clémentine, Magnan, Pierre, Goiffon, Vincent, Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions

Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions

Le Roch, Alexandre, Goiffon, Vincent, Durnez, Clémentine, Magnan, Pierre, Virmontois, Cédric, Pistre, L., Belloir, Jean-Marc, Radiation Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Application

Radiation Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Application

Jay, Antoine, Hémeryck, Anne, Cristiano, Fuccio, Rideau, Denis, Julliard, Pierre-Louis, Goiffon, Vincent, Le Roch, Alexandre, Richard, Nicolas, Martin-Samos, Layla, de Gironcoli, Stefano, Clusters of Defects as a Possible Origin of Random Telegraph Signal in Imager Devices : a DFT based Study

Clusters of Defects as a Possible Origin of Random Telegraph Signal in Imager Devices: a DFT based Study

Cobo, Elie, Massenot, Sébastien, Le Roch, Alexandre, Corbière, Franck, Goiffon, Vincent, Magnan, Pierre, Pelouard, Jean-Luc, Design of a CMOS image sensor pixel with embedded polysilicon nano-grating for near-infrared imaging enhancement

Design of a CMOS image sensor pixel with embedded polysilicon nano-grating for near-infrared imaging enhancement

Jay, Antoine, Hémeryck, Anne, Richard, Nicolas, Martin-Samos, Layla, Raine, Melanie, Le Roch, Alexandre, Mousseau, Normand, Goiffon, Vincent, Paillet, Philippe, Gaillardin, Marc, Magnan, Pierre, Simulation of Single Particle Displacement Damage in Silicon – Part III : First Principles Characterization of Defect Properties

Simulation of Single Particle Displacement Damage in Silicon – Part III: First Principles Characterization of Defect Properties