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Alexandre Le Roch

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  2. Alexandre Le Roch
  3. Research Activities
  4. List of Publications & Conferences

List of Publications & Conferences

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 First author

  • A. Le Roch et al., "Radiation-Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Applications," in IEEE Transactions on Nuclear Science, vol. 65, no. 8, pp. 1645-1653, Aug. 2018.
    doi : 10.1109/TNS.2018.2820385
  • A. Le Roch et al., "Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions," in IEEE Transactions on Nuclear Science, vol. 66, no. 3, pp. 616-624, Mar. 2019.
    doi : 10.1109/TNS.2019.2892645
  • A. Le Roch et al., "Leakage Current Non-Uniformity and Random Telegraph Signal in CMOS Image Sensor Floating Diffusions used for In-Pixel Charge Storage," in Proc. International Image Sensor Workshop (IISW), 2019.
  • A. Le Roch et al., "Comparison of X-Ray and Electron Radiation Effects on Dark Current Non-Uniformity and Fluctuations in CMOS Image Sensors," in IEEE Transactions on Nuclear Science, vol. 67, no. 1, pp. 268 - 277, Oct. 2019.
    doi : 10.1109/TNS.2019.2950086
  • Le Roch et al., "Leakage Current Non-Uniformity and Random Telegraph Signal in CMOS Image Sensor Floating Diffusions used for In-Pixel Charge Storage," in MDPI Sensors, vol. 19, no. 24, pp. 5550, Dec. 2019.
    doi : 10.3390/s19245550
  • Le Roch et al., “Phosphorus Versus Arsenic Role of the Photodiode Doping Implant in CMOS Image Sensor Dark Current and Random Telegraph Signal,” in IEEE Transactions on Nuclear Science, vol. 67, no. 7, pp. 1241 - 1250, Jul. 2020.
    doi : 10.1109/TNS.2020.3003451

 Co-author

  • D. McGrath, S. Tobin, V. Goiffon, M. Sergent, P. Magnan, A. Le Roch, "Dark current limiting mechanisms in CMOS image sensors," in Proc. International Image Sensor Workshop (IISW), 2017.
  • D. McGrath, S. Tobin, V. Goiffon, P. Magnan, A. Le Roch, "Dark current limiting mechanisms in CMOS image sensors," in Electronic Imaging, vol. 2018, no. 11, pp. 354-1-354-8, 2018.
    doi : 10.2352/ISSN.2470-1173.2018.11.IMSE-354
  • C. Durnez, V.Goiffon, C. Virmontois, S. Rizzolo, A. Le Roch, P. Magnan, P. Paillet, C. Marcandella, L. Rubaldo, "Total Ionizing Dose Radiation-Induced Dark Current Random Telegraph Signal in Pinned Photodiode CMOS Image Sensors," in IEEE Transactions on Nuclear Science, vol. 65, no. 1, pp. 92-100, Jan. 2018.
    doi : 10.1109/TNS.2017.2779979
  • A. Jay, A. Hémeryck, N. Richard, L. Martin-Samos, M. Raine, A. Le Roch, N. Mousseau, V. Goiffon, P. Paillet, M. Gaillardin, P. Magnan, "Simulation of Single-Particle Displacement Damage in Silicon—Part III : First Principle Characterization of Defect Properties," in IEEE Transactions on Nuclear Science, vol. 65, no. 2, pp. 724-731, Feb. 2018.
    doi : 10.1109/TNS.2018.2790843
  • V.Goiffon, T.Bilba, T. Deladerrière, G. Beaugendre, A. Le Roch, A. Dion, C. Virmontois, J.-M. Belloir, M. Gaillardin, A. Jay and P. Paillet, "Radiation-Induced Variable Retention Time in Dynamic Random Access Memories," in IEEE Transactions on Nuclear Science, vol. 67, no. 1, pp. 234-244, Jan. 2020.
    doi : 10.1109/TNS.2019.2956293
  • S. Rizzolo, A. Le Roch, O. Marcelot, F. Corbière, P. Paillet, M. Gaillardin, P. Magnan, and V. Goiffon, "High Displacement Damage Dose Effects in Radiation Hardened CMOS Image Sensors," in IEEE Transactions on Nuclear Science, vol. 67, no. 7, pp. 1256 - 1262, Jul. 2020.
    doi : 10.1109/TNS.2020.2989662
  • H. Dewitte, S. Rizzolo, P. Paillet, P. Magnan, A. Le Roch, F. Corbiere, R. Molina, A. Chabane, S. Girard, A. Boukenter, T. Allanche, M. Cyprien, C. Monsanglant-Louvet, M. Osmond, H. Desjonqueres, J.-R Mace, P. Burnichon, J.-P Baudu, F. Saravia, S. Catherin, V. Goiffon, "Annealing Effects on Radiation Hardened CMOS Image Sensors Exposed to Ultra High Total Ionizing Doses," in IEEE Transactions on Nuclear Science, vol. 67, no. 7, pp. 1284 - 1292, Jul. 2020.
    doi : 10.1109/TNS.2020.3001618
  • A. Jay ; A. Hémeryck ; F. Cristiano ; D. Rideau ; P.L. Julliard ; V. Goiffon ; A. LeRoch ; N. Richard ; L. Martin Samos ; S. De Gironcoli, " Clusters of Defects as a Possible Origin of Random Telegraph Signal in Imager Devices : a DFT based Study," in Proc. International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2021.
  • H. Dewitte, P. Paillet, S. Rizzolo, A. Le Roch, C. Marcandella, V. Goiffon, "Ultra-High Total Ionizing Dose Effects on MOSFETs for Analog Applications," in IEEE Transactions on Nuclear Science, vol. 68, no. 5, pp. 697 - 706, May. 2021.
    doi : 10.1109/TNS.2021.3065842
  • H. Dewitte, V. Goiffon, A. Le Roch, S. Rizzolo, A. Jay, M. Jech, A. Hemeryck, P. Paillet, "Junction Leakage Random Telegraph Signals in Arrays of MOSFETs," in IEEE Electron Device Letter, vol. 42, no. 11, pp. 1650 - 1653, Sep. 2021.
    doi : 10.1109/LED.2021.3112296
  • H. Dewitte, V. Goiffon, A. Le Roch, S. Rizzolo, C. Virmontois, C. Marcandella, P. Paillet, "Radiation-Induced Junction Leakage Random Telegraph Signal," in IEEE Transactions on Nuclear Science, vol. 69, no. 3, pp. 290 - 298, Mar. 2022.
    doi : 10.1109/TNS.2021.3119456
  • E. Cobo, S. Massenot, A. Le Roch, F. Corbière, V. Goiffon, P. Magnan, and J.-L. Pelouard, "Design of a CMOS image sensor pixel with embedded polysilicon nano-grating for near-infrared imaging enhancement," in Appl. Opt. vol. 61, no. 4, pp. 960-968, 2022.
    doi : 10.1364/AO.444673
  • H. Dewitte, P. Paillet, A. Le Roch, S. Rizzolo, C. Marcandella, and V. Goiffon, "Hours-long Transient Leakage Current in MOS Structures Induced by High Total-Ionizing-Dose," in IEEE Transactions on Nuclear Science, vol. 69, no. 7, pp. 1428 - 1436, July. 2022.
    doi : 10.1109/TNS.2022.3150407
  • A. Antonsanti, C. Virmontois, J.-M. Lauenstein, A. Le Roch, and V. Goiffon, "Probing Displacement Damage Induced Dark Current in a Small Pitch Vertically Pinned Photodiodes CMOS Image Sensor after Proton Irradiation," in IEEE Transactions on Nuclear Science, vol. 69, no. 7, pp. 1506 - 1514, July. 2022.
    doi : 10.1109/TNS.2022.3160056
  • X. Sun, W. Lu, G. Yang, S. Babu, J.-M. Lauenstein, A. Le Roch, I. Baker, “Effects of proton irradiation on a SAPHIRA HgCdTe avalanche photodiode array,” in Proc. SPIE 12107, Infrared Technology and Applications XLVIII, 121070D, April 2022
    doi : 10.1117/12.2619106
  • S. Beaumont, J.-M. Lauenstein, J. S. Adams, S.R. Bandler, J.A Chervenak, F.M Finkbeiner, S.V. Hull, R.L. Kelley, C.A Kilbourne, A. Le Roch, H. Muramatsu, F.S Porter, K. Sakai, S.J. Smith, N.A. Wakeham, E.J. Wassell, S. Yoon, "Effect of Space Radiation on Transition-Edge Sensor Detectors Performance," in IEEE Transactions on Applied Superconductivity, vol. 33, no. 5, pp. 1-6, Aug. 2023.
    doi : 10.1109/TASC.2023.3264955
  • A. Antonsanti, Vincent Goiffon, François Roy, Alexandre Le Roch, Landen D. Ryder, Victor Malherbe, Philippe Roche, Olivier Nier, Cédric Virmontois, Jean-Marie Lauenstein, "Ionizing Radiation Effects on Hole Collection Backside-Illuminated P-Type Deep-Trench Pinned Photo-MOS Pixels under Image Acquisition," in IEEE Transactions on Nuclear Science, vol. 70, no. 8, pp. 1958 - 1965, Aug. 2023.
    doi : 10.1109/TNS.2023.3262769

 List of Conference and Workshop Presentations

Presenting author : A. Jay

  • A. Jay, A. Hémeryck, N. Richard, L. Martin-Samos, M. Raine, A. Le Roch, N. Mousseau, V. Goiffon, P. Paillet, M. Gaillardin, P. Magnan, "Simulation of Single-Particle Displacement Damage in Silicon—Part III : First Principle Characterization of Defect Properties," in IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2017.

Presenting author : C. Durnez / Outstanding Student Paper Award

  • C. Durnez, V.Goiffon, C. Virmontois, S. Rizzolo, A. Le Roch, P. Magnan, P. Paillet, C. Marcandella, L. Rubaldo, "Total Ionizing Dose Radiation-Induced Dark Current Random Telegraph Signal in Pinned Photodiode CMOS Image Sensors," in IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2017.

Presenting author : A. Le Roch

  • A. Le Roch et al., "Radiation-Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Applications," in IEEE European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2017.

Presenting author : A. Le Roch

  • A. Le Roch et al., "Radiation-Induced Defects in a Commercial Image Sensor," in Workshop CNES : CMOS image sensors for high-performance applications, 2017.

Presenting author : D. McGrath

  • D. McGrath, S. Tobin, V. Goiffon, M. Sergent, P. Magnan, A. Le Roch, "Dark current limiting mechanisms in CMOS image sensors," in International Image Sensor Workshop (IISW), 2017.

Presenting author : A. Le Roch

  • A. Le Roch et al., "Radiation-Induced Dark Current Increase in Pinned Photodiode CMOS Image Sensors," in CNES Ph. D. students conference, 2018.

Presenting author : A. Le Roch

  • A. Le Roch et al., "Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions," in IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2018.

Presenting author : A. Le Roch

  • A. Le Roch et al., "Radiation-Induced Leakage Current in CMOS Image Sensor Sense Node Floating Diffusions," in Workshop CNES : Radiation effects on solid-state optoelectronic detectors, 2018.

Presenting author : A. Le Roch / Best Poster Award

  • A. Le Roch et al., "Leakage Current Non-Uniformity and Random Telegraph Signal in CMOS Image Sensor Floating Diffusions used for In-Pixel Charge Storage," in International Image Sensor Workshop (IISW), 2019.

Presenting author : V. Goiffon / Meritorious Paper Award

  • V.Goiffon, T.Bilba, T. Deladerrière, G. Beaugendre, A. Le Roch, A. Dion, C. Virmontois, J.-M. Belloir, M. Gaillardin, A. Jay and P. Paillet, "Radiation-Induced Variable Retention Time in Dynamic Random Access Memories," in IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2019.

Presenting author : A. Le Roch

  • A. Le Roch et al., "Comparison of X-Ray and Electron Radiation Effects on Dark Current Non-Uniformity and Fluctuations in CMOS Image Sensors," in IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2019.

Presenting author : A. Le Roch / Best Student Paper Award & Best Paper Award

  • A. Le Roch et al., "Phosphorus Versus Arsenic Role of the Photodiode Doping Implant in CMOS Image Sensor Dark Current and Random Telegraph Signal," in IEEE European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2019.

Presenting author : V. Goiffon

  • S. Rizzolo, A. Le Roch, O. Marcelot, F. Corbière, P. Paillet, M. Gaillardin, P. Magnan, and V. Goiffon, "High Displacement Damage Dose Effects in Radiation Hardened CMOS Image Sensors," in IEEE European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2019.

Presenting author : H. Dewitte

  • H. Dewitte, S. Rizzolo, P. Paillet, P. Magnan, A. Le Roch, F. Corbiere, R. Molina, A. Chabane, S. Girard, A. Boukenter, T. Allanche, M. Cyprien, C. Monsanglant-Louvet, M. Osmond, H. Desjonqueres, J.-R Mace, P. Burnichon, J.-P Baudu, F. Saravia, S. Catherin, V. Goiffon, "Annealing Effects on Radiation Hardened CMOS Image Sensors Exposed to Ultra High Total Ionizing Doses," in IEEE European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2019.

Presenting author : H. Dewitte

  • H. Dewitte, P. Paillet, S. Rizzolo, A. Le Roch, C. Marcandella, V. Goiffon, "Ultra-High Total Ionizing Dose Effects on MOSFETs for Analog Applications," in IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2020.

Presenting author : H. Dewitte

  • H. Dewitte, V. Goiffon, A. Le Roch, S. Rizzolo, C. Virmontois, C. Marcandella, P. Paillet, "Radiation-Induced Junction Leakage Random Telegraph Signal," in IEEE European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2020.

Presenting author : A. Jay

  • A. Jay ; A. Hémeryck ; F. Cristiano ; D. Rideau ; P.L. Julliard ; V. Goiffon ; A. LeRoch ; N. Richard ; L. Martin Samos ; S. De Gironcoli, " Clusters of Defects as a Possible Origin of Random Telegraph Signal in Imager Devices : a DFT based Study," in International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2021.

Presenting author : H. Dewitte

  • H. Dewitte, P. Paillet, A. Le Roch, S. Rizzolo, C. Marcandella, and V. Goiffon, "Hours-long Transient Leakage Current in MOS Structures Induced by High Total-Ionizing-Dose," in IEEE European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2021.

Presenting author : A. Antonsanti

  • A. Antonsanti, C. Virmontois, J.-M. Lauenstein, A. Le Roch, and V. Goiffon, "Probing Displacement Damage Induced Dark Current in a Small Pitch Vertically Pinned Photodiodes CMOS Image Sensor after Proton Irradiation," in IEEE European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2021.

Presenting author : X. Sun

  • X. Sun, W. Lu, G. Yang, S. Babu, J.-M. Lauenstein, A. Le Roch, I. Baker, “Effects of proton irradiation on a SAPHIRA HgCdTe avalanche photodiode array,” in SPIE 12107, Infrared Technology and Applications XLVIII, 121070D, May 2022.

Presenting author : A. Le Roch

  • A. Le Roch, J.-M. Lauenstein, “Radiation hardness assurance for photodetectors and image sensors : development of test guidelines,” in 2022 NEPP Electronic and Technology Workshop (ETW), June 2022.

Presenting author : A. Le Roch

  • A. Le Roch, J.-M. Lauenstein, “Single event effects in image sensors,” in 2022 Single Event Effects (SEE) Symposium & Military and Aerospace Programmable Logic Devices (MAPLD) Workshop, May 2022.

Presenting author : S. Beaumont

  • S. Beaumont, J.-M. Lauenstein, J. S. Adams, S.R. Bandler, J.A Chervenak, F.M Finkbeiner, S.V. Hull, R.L. Kelley, C.A Kilbourne, A. Le Roch, H. Muramatsu, F.S Porter, K. Sakai, S.J. Smith, N.A. Wakeham, E.J. Wassell, S. Yoon, "Effect of Space Radiation on Transition-Edge Sensor Detectors Performance," in 2022 Applied Superconductivity Conference (ASC), Oct. 2022

Presenting author : A. Antonsanti

  • A. Antonsanti, Vincent Goiffon, François Roy, Alexandre Le Roch, Landen D. Ryder, Victor Malherbe, Philippe Roche, Olivier Nier, Cédric Virmontois, Jean-Marie Lauenstein, "Ionizing Radiation Effects on Hole Collection Backside-Illuminated P-Type Deep-Trench Pinned Photo-MOS Pixels under Image Acquisition," in IEEE European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2022

Presenting author : A. Le Roch

  • A. Le Roch, J.-M. Lauenstein, “Radiation hardness assurance for photodetectors and image sensors,” in 2023 JEDEC meeting, May 2023.

 Honours & Awards

  • 2018 – Outstanding Student Paper - NSREC conference | IEEE Nuclear and Plasma Science Society.
  • 2019 – International Paul Phelps Award | IEEE Nuclear and Plasma Science Society (NPSS).
  • 2019 – Best Poster Award | International Image Sensor Workshop (IISW).
  • 2019 – Best Student & Best Paper - RADECS conference | IEEE Nuclear and Plasma Science Society.
  • 2019 – Meritorious Paper - NSREC conference | IEEE Nuclear and Plasma Science Society.
  • 2020 – Best Ph.D. Thesis Award | ISAE-SUPAERO Foundation
  • 2020 – Best Ph.D. Thesis Award | Doctoral School
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