Flux 5 dernières publis DEOS

Bidon Stéphanie, Roche Sébastien - 176326383, On the Equivalence between Kalman Filter at Steady State and DPLL. 2024, Signal Processing. 224. 109591

On the Equivalence between Kalman Filter at Steady State and DPLL

Zivuku, Progress, Kisseleff, Steven, Nguyen, Van-Dinh, Martins, Wallace, Ntontin, Konstantinos, Chatzinotas, Symeon, Ottersten, Björn, Joint RIS-aided Precoding and Multislot Scheduling for Maximum User Admission in Smart Cities. 2024, IEEE Transactions on Communications. 72 (1). 418-433. ISSN 0090-6778

Joint RIS-aided Precoding and Multislot Scheduling for Maximum User Admission in Smart Cities

Grislain Paul, Auddino Alexia, Barraqué Anna, Lamothe François - 261609556, Hotescu Oana Andreea, Lacan Jérôme, Radzik José, Lochin Emmanuel - 08943174X, Rethinking LEO constellations routing. 2024, International Journal of Satellite Communications and Networking. ISSN 1542-0973

Rethinking LEO constellations routing

Salih Alj Antoine, Touron Pierre, Roy François, Tournier, Arnaud, Michelot Julien, Demiguel, Stéphane, Virmontois Cédric - 171656768, Lalucaa Valerian, Magnan Pierre - 16218221X, Goiffon Vincent, Dark Current and Clock-Induced Charges in a Fully Depleted Charge Domain CDTI-Based CCD-on-CMOS Image Sensor. 2024, IEEE Sensors Journal. 24 (16). 25652 - 25661. ISSN 1530-437X

Dark Current and Clock-Induced Charges in a Fully Depleted Charge Domain CDTI-Based CCD-on-CMOS Image Sensor

Salih Alj Antoine, Touron Pierre, Roy François, Demiguel, Stéphane, Michelot Julien, Lalucaa Valerian, Virmontois Cédric, Magnan Pierre, Goiffon Vincent, Total Ionizing Dose Effects on a CDTI based CCD-on-CMOS through Buildup of Interface Traps and Oxide Charges. 2024, IEEE Transactions on Nuclear Science. 71 (8). 1774 - 1782. ISSN 0018-9499

Total Ionizing Dose Effects on a CDTI based CCD-on-CMOS through Buildup of Interface Traps and Oxide Charges